NIS Ge Calibration Report #1

From: Jim Bell

Date: 1/25/95

Subject: NIS Ge Calibration Report #1

I have begun looking into the linearity of the NIS flight Ge detectors using the calibration test data obtained at APL and recently provided by Scott. This is a report of progress that has been made to date.

BACKGROUND:

I used the calibration data files located on the machine retro.jhuapl.edu in the directory /project/near/SDC/NIS/CalData/Ge. The data are grouped into 5 files; 2 for room temperature tests and 3 at lower temperatures. Tests at all 4 temperatures were conducted in a vacuum, and one test at room temperature was conducted at ambient pressure. Measurements at 8 wavelengths from 800 to 1500 nm were made at two gain settings (1 and 10).

The measurements were obtained by illuminating the line array with a constant light source and using 6 different ND filters to vary the incident light level. Scott has warned that absolute calibration and flatfield corections are not possible using these data because the light source viewed by the detectors was not uniformly flat. However, each detector can be treated as an independent entity for these tests, and measurements of the linearity of each detector can be carried out.

Unfortunately, I do not (yet) have Kaleidograph or other fancy spreadsheet/plotting programs, so I wrote a simple fortran program to decipher the data using the information in the file HEADER provided by Scott, and then I generated plot outputs in postscript format. [NB: Malin converted the postscript files to GIFs and translated the ACIII text file to html for posting here].

RESULTS:

Determination of relative incident light levels

Nominally in linearity testing, one would want to generate plots of detector voltage (or DN) versus exposure time for a constant source. However, this was not practical for the current set-up and so ND filters were used to vary the incident flux, thus producing the same effect as if the exposure time had been changed. The key to this process is to be able to accurately determine how much the incident flux is varying through each of the ND filters.

Included with the calibration data provided by Scott is a file called "lamp" that contains absolute flux information for the light source used in these tests. This flux data was obtained using a different, well-calibrated detector placed at the same position in the test apparatus as the Ge line array. Flux measurements were made through each of the ND filters and at each wavelength. Figure 1 shows the resulting absolute flux data, plotted on a logarithmic y-axis because ND filters are incremented in exponential light-reducing steps. This ND filter set allows for 6 different light levels incident on the detectors. Note that the shapes of the spectra obtained through each ND filter are different, indicating (not surprisingly) that the spectral repsonse function of each ND filter is slightly different. A second measurement of absolute flux values included in the same file allows an estimate of the errors to be obtained. I find one-sigma errors of from 0.05% to 0.22% for these measurements, which indicates excellent repeatability.


Figure 1: Absolute Flux vs. Wavelength for Ge detector

In order to derive the linearity results discussed below, I divided each of the spectra in Fig. 1 by the spectrum of the ND 0.0 (no ND flux reduction) spectrum. This gives a family of relative flux curves (Figure 2) for these filters and allows one to accurately determine what the flux reduction level at each wavelength is for each of the ND filters. This also provides a neat graphical representation of what the number after "ND" means for each of these filters, and why you really shouldn't believe that number at face value without testing it (vis. the large variations in the ND 2.5 filter). So, at each wavelength, the relative flux ratio values of Fig. 2 can be used as a surrogate for exposure time variations on the x-axis of a detector linearity plot.


Figure 2: Absolute Flux vs. Wavelength for Ge detector

Linearity calculations, T = -26 degrees

I have looked at the linearity behavior of the Ge detectors starting with the lowest temperature measurements. As Scott has pointed out, there are almost 100 different measurement conditions (wavelength, ND filters, gain state) at each temperature. This means that one must come up with a clever way to display the linearity results for all 32 detectors or else face the prospect of sifting through hundreds of plots. I think I've come up with a way, which I'll show below. First, I will walk through the procedure for a few specific detectors at a few wavelengths as representative examples.

Figure 3 shows the behavior of detector 10 (chosen arbitrarily) measured in vacuum at 800 nm, gain state of 1, and temperature = -26. The y-axis plots all of the measured detector DN values, and the x-axis is the relative flux, taken directly from Fig. 2. From 4 to 20 measurements were made at each wavelength through each ND filter, which is why there are multiple points shown at each flux level. Each of these points was used to formally derive the regression curve shown. This detector is, as you can see, behaving quite nicely over the 40 to 100 DN range, with a linear goodness-of-fit value of 0.9987.


Figure 3: Ge detector #10, 800 nm, Gain State = 1

Figure 4 shows data obtained under identical conditions as Fig. 3, except that the gain state is now 10 instead of 1. The range of DN values is correspondingly large (up to about 600 DN), but this detector is still behaving quite nicely, with R**2 = 0.9999. Again, all of the measurements were used to derive the fit.


Figure 4: Ge detector #10, 800 nm, Gain State = 10

Figure 5 shows data obtained at 1500 nm for the same detector and at gain state 1, temperature = -26, in vacuum. At this wavelength, the detector is also behaving linearly.


Figure 5: Ge detector #10, 1500 nm, Gain State = 1

Figure 6 shows data obtained under identical conditions as Fig. 5, except that the gain state is now 10. Here, we have run into detector saturation somewhere above 0.4 relative flux units, and so the overall linear regression does not fit well. Up to 0.4 relative flux units, though, the detector appears to be in the linear regime.


Figure 6: Ge detector #10, 1500 nm, Gain State = 10

512 such plots would have to be made to show the behavior of each detector over the range of conditions tested. Instead (thankfully), I have developed a smaller family of just 16 plots similar to that shown in Figure 7. What I have plotted in this figure is a "spectrum" of the linear fit coefficients and the R**2 values at a particular wavelength (800 nm) and gain state (1). Each of the detectors' regression analyses was performed separately, and the results have been combined here. For example, the values of slope, offset, and R**2 for detector 10 come from an analysis identical to that shown in Fig. 3.


Figure 7: Spectrum of Linear Fit Coefficients at 800 nm and Gain State = 1

This is how I would use the results in Figure 7: I pay most attention to the bottom plot, which shows how well each detector's calibration data is best fit by a linear curve. In this case, I would argue that detectors 1 and 4-32 are behaving well, but that detectors 2 and 3 are slightly anomalous and so perhaps I should go back and produce plots like Fig. 3 for these detectors to see if there were bad data points or some other reasons for the poorer fit.

I do not understand why there is a sudden jump in slope and offset between detectors 1-22 and 23-32. Perhaps this is a peculiarity having to do with the way the line array is manufactured. Or, perhaps this is a manifestation of spatial variations in the lamp's input flux across the array. Regardless, note that there is no substantial change in the R**2 value, so that although these elements may be behaving differently, they are still behaving well. This is exactly why accurate flatfielding will be essential once we start instrument level tests.

Finally, Figure 8 shows an example of rather poor linearity performance, at 900 nm and gain state 1. Figure 9 shows that the reasons for this poor performance was a set of highly variable DN measurements obtained near relative flux 0.35 (through the ND 0.5 filter). If outlier measurements are discarded from the data, then the linearity is seen to still be quite good at 900 nm.


Figure 8: Spectrum of Linear Fit Coefficients at 900 nm and Gain State = 1


Figure 9: Variable DN Measurements at 900 nm, ND 0.5, Gain State = 1

I have examined the 14 other possible figures like Figs. 7 and 8, and note that except for times when the detectors saturate and for the single case in Fig. 8, all of the detectors exhibit linear performance above the R**2 = 0.999 level at every wavelength.

CONCLUSIONS:

(1) At T=-26 degrees, the flight Ge detectors all appear to exhibit excellent linear behavior over the range of incident flux sampled.

(2) The technique of using ND filters to regulate the incident flux is sound, however it is not optimal because many of the measurement situations do not allow the detectors to measure flux levels in the important range between half-full and saturation. Thus, in my opinion, these test results are not appropriate for determining whether or not the detectors are linear over the entire range of non-saturated DN values. At some point, we must perform tests that sample more finely the DN space (including the highest and lowest ranges) in plots such as Fig. 3.

FUTURE WORK:

(1) Characterize the linearity behavior at the other temperatures and in non-vacuum conditions.

(2) Generate explicit plots of linearity vs. wavelength for each detector to determine the magnitude, if any, of small wavelength-dependent effects.

As always, any comments, questions, or suggestions from team members or any of the engineers would be greatly welcome.

Contact: jimbo@anarchy.arc.nasa.gov